Product Number:EVAL_DCP_01
申请注释
The Dynamic Characterization Platform is designed to:
- Measure
- MOSFET切换损耗,切换时间和门电量准确
- Schottky屏障二极管(SBD)和身体二极管反向恢复准确
- 为门驱动和电源循环PCB布局提供知情的参考设计
- 提供有关门驱动器布局和组件的知情建议
- Promote streamlined device validation and quicker design cycles